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DNA Damage Recognition

List Price: $89.99
SKU:
9780367392130
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25 unit(s)
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  • Product Details

    Author:
    Wolfram Siede, Paul W. Doetsch
    Format:
    Paperback
    Pages:
    896
    Publisher:
    CRC Press (October 18, 2019)
    Language:
    English
    Audience:
    Professional and scholarly
    ISBN-13:
    9780367392130
    Weight:
    16oz
    Dimensions:
    7" x 10"
    File:
    TAYLORFRANCIS-TayFran_260403050835162-20260403.xml
    Folder:
    TAYLORFRANCIS
    List Price:
    $89.99
    As low as:
    $85.49
    Publisher Identifier:
    P-CRC
    Discount Code:
    H
    Pub Discount:
    30
    Country of Origin:
    United States
    Imprint:
    CRC Press
    Case Pack:
    1
  • Overview

    Covering an array of topics, this authoritative work summarizes recent developments, while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways. Richly illustrated, this guide discusses the theoretical aspects of DNA damage recognition, exploring those that are relevant for various regulatory responses, such as transcriptional regulation or checkpoint arrest. It also details key concepts in the recognition of bulky DNA base damage, reviews the excision repair of non-bulky base damage, covers short-patch repair and the recognition and repair of single- and double-strand breaks.