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DNA Damage Recognition
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$89.99
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Product Details
Author:
Wolfram Siede, Paul W. Doetsch
Format:
Paperback
Pages:
896
Publisher:
CRC Press (October 18, 2019)
Language:
English
Audience:
Professional and scholarly
ISBN-13:
9780367392130
Weight:
16oz
Dimensions:
7" x 10"
File:
TAYLORFRANCIS-TayFran_260403050835162-20260403.xml
Folder:
TAYLORFRANCIS
List Price:
$89.99
As low as:
$85.49
Publisher Identifier:
P-CRC
Discount Code:
H
Pub Discount:
30
Country of Origin:
United States
Imprint:
CRC Press
Case Pack:
1
Overview
Covering an array of topics, this authoritative work summarizes recent developments, while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways. Richly illustrated, this guide discusses the theoretical aspects of DNA damage recognition, exploring those that are relevant for various regulatory responses, such as transcriptional regulation or checkpoint arrest. It also details key concepts in the recognition of bulky DNA base damage, reviews the excision repair of non-bulky base damage, covers short-patch repair and the recognition and repair of single- and double-strand breaks.








