Trace Elemental Analysis of Metals (Methods and Techniques)
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$89.99
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Product Details
Author:
Thomas R. Dulski
Format:
Paperback
Pages:
592
Publisher:
CRC Press (September 23, 2019)
Language:
English
ISBN-13:
9780367399696
Weight:
16oz
Dimensions:
6.125" x 9.1875"
File:
TAYLORFRANCIS-TayFran_260403050835162-20260403.xml
Folder:
TAYLORFRANCIS
List Price:
$89.99
As low as:
$85.49
Publisher Identifier:
P-CRC
Discount Code:
H
Audience:
Professional and scholarly
Country of Origin:
United States
Pub Discount:
30
Case Pack:
1
Imprint:
CRC Press
Overview
This work details minor, trace and ultratrace methods; addresses the essential stages that precede measurement; and highlights the measurement systems most likey to be used by the pragmatic analyst. It features key material on inclusion and phase isolation. The book is designed to provide useful maps and signposts for metals analysts who must verify that stringent trace level compositional specifications have been met.
