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Statistical Analysis of Spatial and Spatio-Temporal Point Patterns

List Price: $65.99
SKU:
9781032477473
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  • Product Details

    Author:
    Peter J. Diggle
    Format:
    Paperback
    Pages:
    300
    Publisher:
    CRC Press (January 21, 2023)
    Language:
    English
    ISBN-13:
    9781032477473
    Weight:
    19.125oz
    Dimensions:
    6.125" x 9.1875"
    File:
    TAYLORFRANCIS-TayFran_260403050944986-20260403.xml
    Folder:
    TAYLORFRANCIS
    List Price:
    $65.99
    Series:
    Chapman & Hall/CRC Monographs on Statistics and Applied Probability
    As low as:
    $62.69
    Publisher Identifier:
    P-CRC
    Discount Code:
    H
    Audience:
    Professional and scholarly
    Country of Origin:
    United States
    Case Pack:
    30
    Pub Discount:
    30
    Imprint:
    Chapman and Hall/CRC
  • Overview

    Written by a prominent statistician and author, the first edition of this bestseller broke new ground in the then emerging subject of spatial statistics with its coverage of spatial point patterns. Retaining all the material from the second edition and adding substantial new material, Statistical Analysis of Spatial and Spatio-Temporal Point Patterns, Third Edition presents models and statistical methods for analyzing spatially referenced point process data.





    Reflected in the title, this third edition now covers spatio-temporal point patterns. It explores the methodological developments from the last decade along with diverse applications that use spatio-temporally indexed data. Practical examples illustrate how the methods are applied to analyze spatial data in the life sciences.





    This edition also incorporates the use of R through several packages dedicated to the analysis of spatial point process data. Sample R code and data sets are available on the author’s website.