- Home
- Technology & Engineering
- Electronics
- Soft Errors (From Particles to Circuits)
Soft Errors (From Particles to Circuits)
List Price:
$233.99
- Availability: Confirm prior to ordering
- Branding: minimum 50 pieces (add’l costs below)
- Check Freight Rates (branded products only)
Branding Options (v), Availability & Lead Times
- 1-Color Imprint: $2.00 ea.
- Promo-Page Insert: $2.50 ea. (full-color printed, single-sided page)
- Belly-Band Wrap: $2.50 ea. (full-color printed)
- Set-Up Charge: $45 per decoration
- Availability: Product availability changes daily, so please confirm your quantity is available prior to placing an order.
- Branded Products: allow 10 business days from proof approval for production. Branding options may be limited or unavailable based on product design or cover artwork.
- Unbranded Products: allow 3-5 business days for shipping. All Unbranded items receive FREE ground shipping in the US. Inquire for international shipping.
- RETURNS/CANCELLATIONS: All orders, branded or unbranded, are NON-CANCELLABLE and NON-RETURNABLE once a purchase order has been received.
Product Details
Author:
Jean-Luc Autran, Daniela Munteanu
Format:
Hardcover
Pages:
439
Publisher:
CRC Press (February 25, 2015)
Imprint:
CRC Press
Language:
English
Audience:
Professional and scholarly
ISBN-13:
9781466590830
Weight:
28.25oz
Dimensions:
7" x 10"
File:
TAYLORFRANCIS-TayFran_261002043444689-20261002.xml
Folder:
TAYLORFRANCIS
List Price:
$233.99
Country of Origin:
United States
Pub Discount:
30
Series:
Devices, Circuits, and Systems
Case Pack:
10
As low as:
$222.29
Publisher Identifier:
P-CRC
Discount Code:
H
Overview
This book addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment, providing comprehensive knowledge of the complete chain of the physics of soft errors. The text discusses particle interactions with matter, soft-error mechanisms, and instrumentation developments in environment characterization, particle detection, and real-time and accelerated tests. It describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits. It also explores trends for future technological nodes and emerging devices.
