High Resolution X-Ray Diffractometry And Topography
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$94.99
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Product Details
Author:
D.K. Bowen, Brian K. Tanner
Format:
Paperback
Pages:
264
Publisher:
CRC Press (October 10, 2019)
Language:
English
Audience:
Professional and scholarly
ISBN-13:
9780367400637
Weight:
17.375oz
Dimensions:
6.875" x 9.6875"
File:
TAYLORFRANCIS-TayFran_260411045024614-20260411.xml
Folder:
TAYLORFRANCIS
List Price:
$94.99
Country of Origin:
United States
As low as:
$90.24
Publisher Identifier:
P-CRC
Discount Code:
H
Pub Discount:
30
Imprint:
CRC Press
Case Pack:
1
Overview
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
