null
Loading... Please wait...
FREE SHIPPING on All Unbranded Items LEARN MORE
Print This Page

High-Power Piezoelectrics and Loss Mechanisms

List Price: $65.99
SKU:
9780367540722
Quantity:
Minimum Purchase
25 unit(s)
  • Availability: Confirm prior to ordering
  • Branding: minimum 50 pieces (add’l costs below)
  • Check Freight Rates (branded products only)

Branding Options (v), Availability & Lead Times

  • 1-Color Imprint: $2.00 ea.
  • Promo-Page Insert: $2.50 ea. (full-color printed, single-sided page)
  • Belly-Band Wrap: $2.50 ea. (full-color printed)
  • Set-Up Charge: $45 per decoration
FULL DETAILS
  • Availability: Product availability changes daily, so please confirm your quantity is available prior to placing an order.
  • Branded Products: allow 10 business days from proof approval for production. Branding options may be limited or unavailable based on product design or cover artwork.
  • Unbranded Products: allow 3-5 business days for shipping. All Unbranded items receive FREE ground shipping in the US. Inquire for international shipping.
  • RETURNS/CANCELLATIONS: All orders, branded or unbranded, are NON-CANCELLABLE and NON-RETURNABLE once a purchase order has been received.
  • Product Details

    Author:
    Kenji Uchino
    Format:
    Paperback
    Pages:
    380
    Publisher:
    CRC Press (August 26, 2024)
    Language:
    English
    ISBN-13:
    9780367540722
    Weight:
    16oz
    Dimensions:
    7" x 10"
    File:
    TAYLORFRANCIS-TayFran_260411044132225-20260411.xml
    Folder:
    TAYLORFRANCIS
    List Price:
    $65.99
    Country of Origin:
    United States
    Pub Discount:
    30
    Case Pack:
    1
    As low as:
    $62.69
    Publisher Identifier:
    P-CRC
    Discount Code:
    H
    Imprint:
    CRC Press
  • Overview

    This textbook introduces the theoretical background of piezoelectrics, electromechanial phenomenology, loss mechanisms, practical materials, device designs, drive and characterization techniques, typical applications, and looks forward to the future perspectives in this field.