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Distress Risk and Corporate Failure Modelling (The State of the Art)

List Price: $73.99
SKU:
9781138652507
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  • Product Details

    Author:
    Stewart Jones
    Format:
    Paperback
    Pages:
    242
    Publisher:
    Taylor & Francis (September 15, 2022)
    Language:
    English
    ISBN-13:
    9781138652507
    Weight:
    13.625oz
    Dimensions:
    6.125" x 9.1875"
    File:
    TAYLORFRANCIS-TayFran_260519045159724-20260519.xml
    Folder:
    TAYLORFRANCIS
    List Price:
    $73.99
    Series:
    Routledge Advances in Management and Business Studies
    Case Pack:
    1
    As low as:
    $70.29
    Publisher Identifier:
    P-CRC
    Discount Code:
    H
    Audience:
    College/higher education
    Country of Origin:
    United States
    Pub Discount:
    30
    Imprint:
    Routledge
  • Overview

    This book is an introduction text to distress risk and corporate failure modelling techniques. It illustrates how to apply a wide range of corporate bankruptcy prediction models and, in turn, highlights their strengths and limitations under different circumstances. It also conceptualises the role and function of different classifiers in terms of a trade-off between model flexibility and interpretability.

    Jones's illustrations and applications are based on actual company failure data and samples. Its practical and lucid presentation of basic concepts covers various statistical learning approaches, including machine learning, which has come into prominence in recent years. The material covered will help readers better understand a broad range of statistical learning models, ranging from relatively simple techniques, such as linear discriminant analysis, to state-of-the-art machine learning methods, such as gradient boosting machines, adaptive boosting, random forests, and deep learning.

    The book’s comprehensive review and use of real-life data will make this a valuable, easy-to-read text for researchers, academics, institutions, and professionals who make use of distress risk and corporate failure forecasts.