null
Loading... Please wait...
FREE SHIPPING on All Unbranded Items LEARN MORE
Print This Page

Applied Reliability

List Price: $66.99
SKU:
9781032918334
Quantity:
Minimum Purchase
25 unit(s)
  • Availability: Confirm prior to ordering
  • Branding: minimum 50 pieces (add’l costs below)
  • Check Freight Rates (branded products only)

Branding Options (v), Availability & Lead Times

  • 1-Color Imprint: $2.00 ea.
  • Promo-Page Insert: $2.50 ea. (full-color printed, single-sided page)
  • Belly-Band Wrap: $2.50 ea. (full-color printed)
  • Set-Up Charge: $45 per decoration
FULL DETAILS
  • Availability: Product availability changes daily, so please confirm your quantity is available prior to placing an order.
  • Branded Products: allow 10 business days from proof approval for production. Branding options may be limited or unavailable based on product design or cover artwork.
  • Unbranded Products: allow 3-5 business days for shipping. All Unbranded items receive FREE ground shipping in the US. Inquire for international shipping.
  • RETURNS/CANCELLATIONS: All orders, branded or unbranded, are NON-CANCELLABLE and NON-RETURNABLE once a purchase order has been received.
  • Product Details

    Author:
    Paul A. Tobias, David Trindade
    Format:
    Paperback
    Pages:
    600
    Publisher:
    CRC Press (October 14, 2024)
    Language:
    English
    Audience:
    College/higher education
    ISBN-13:
    9781032918334
    Dimensions:
    7" x 10"
    File:
    TAYLORFRANCIS-TayFran_260820043505820-20260820.xml
    Folder:
    TAYLORFRANCIS
    List Price:
    $66.99
    Country of Origin:
    United States
    Pub Discount:
    30
    As low as:
    $63.64
    Publisher Identifier:
    P-CRC
    Discount Code:
    H
    Weight:
    39.25oz
    Imprint:
    Chapman and Hall/CRC
    Case Pack:
    1
  • Overview

    This easy-to-use guide addresses basic descriptive statistics, reliability concepts, exponential distribution, Weibull distribution, and lognormal distribution. It also covers reliability data plotting, acceleration models, life test data analysis and systems models, and much more. The third edition includes a new chapter on Bayesian reliability