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Advanced Methods in Automatic Item Generation - 9780367458324

List Price: $57.99
SKU:
9780367458324
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  • Product Details

    Author:
    Mark J. Gierl, Hollis Lai, Vasily Tanygin
    Format:
    Paperback
    Pages:
    246
    Publisher:
    Taylor & Francis (May 19, 2021)
    Language:
    English
    ISBN-13:
    9780367458324
    Weight:
    16oz
    Dimensions:
    6" x 9"
    File:
    TAYLORFRANCIS-TayFran_260110060643920-20260110.xml
    Folder:
    TAYLORFRANCIS
    List Price:
    $57.99
    As low as:
    $55.09
    Publisher Identifier:
    P-CRC
    Discount Code:
    H
    Case Pack:
    1
    Pub Discount:
    30
    Audience:
    College/higher education
    Country of Origin:
    United States
    Imprint:
    Routledge
  • Overview

    Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today’s technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and Internet use, assessment stakeholders—from graduate students to scholars to industry professionals—have numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG, as well as the practical considerations required to produce and apply large numbers of useful test items.